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Items where Author is "Ahmed, Akram Ben"

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Number of items: 4.

Article

Dang, Nam Khanh and Ahmed, Akram Ben and Okuyama, Yuichi and Abdallah, Abderazek Ben (2017) Scalable design methodology and online algorithm for TSV-cluster defects recovery in highly reliable 3D-NoC systems. IEEE Transactions on Emerging Topics in Computing . ISSN 2168-6750 (In Press)

Dang, Nam Khanh and Ahmed, Akram Ben and Tran, Xuan Tu and Okuyama, Yuichi and Abdallah, Abderazek Ben (2017) A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25 (11). pp. 3099-3112. ISSN 1063-8210

Conference or Workshop Item

Dang, Nam Khanh and Ahmed, Akram Ben and Tran, Xuan Tu (2019) An on-communication multiple-TSV defects detection and localization for real-time 3D-ICs. In: 2019 IEEE 13th International Symposium on embedded Multicore/Manycore Systems-on-Chip (IEEE MCSoC-2019), 1-3 October 2019, Singapore. (In Press)

Dang, Nam Khanh and Ahmed, Akram Ben and Abdallah, Abderazek Ben and Tran, Xuan Tu (2019) TSV-IaS: Analytic analysis and low-cost non-preemptive on-line detection and correction method for TSV defects. In: 2019 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 15-17 July 2019, Florida, USA.

This list was generated on Tue Nov 19 06:38:56 2019 +07.